可訂購部件
| 型號 | 可訂購的器件編號 | 訂購代碼(12NC) | 封裝 | 從經銷商處購買 |
|---|---|---|---|---|
| BAT54XY | BAT54XY,115 | 934059127115 | SOT363 | 訂單產品 |
| BAT54XY | BAT54XYH | 934059127125 | SOT363 | 訂單產品 |
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Schottky barrier diode
Schottky barrier quadruple diode with an integrated guard ring for stress protection. Two electrically isolated dual Schottky barrier diodes series, encapsulated in a very small SOT363 (SC-88) Surface-Mounted Device (SMD) plastic package.
Features and benefits
Low forward voltage
Low capacitance
Applications
Ultra high-speed switching
Line termination
Voltage clamping
Reverse polarity protection
參數類型
| 型號 | Package version | Package name | Size (mm) | VR [max] (V) | IF [max] (mA) | Configuration | VF [max] (mV) | Cd [max] (pF) | @VR (V) | IR [max] (μA) | @VR (V) | Automotive qualified |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| BAT54XY | SOT363 | TSSOP6 | 2.1 x 1.25 x 0.95 | 30.0 | 200.0 | series connected | 800@IF=100mA | 10.0 | 1.0 | 2.0 | 25.0 | Y |
封裝
| 型號 | 可訂購的器件編號，（訂購碼(12NC)） | 狀態(tài) | 標示 | 封裝 | 外形圖 | 回流焊/波峰焊 | 包裝 |
|---|---|---|---|---|---|---|---|
| BAT54XY | BAT54XY,115 (934059127115) |
Active | %C5 |
TSSOP6 (SOT363) |
SOT363 |
WAVE_BG-BD-1
|
SOT363_115 |
| BAT54XYH (934059127125) |
Active | %C5 | SOT363_125 |
Boards
| Part number | Description | Type | Quick links | Shop link |
|---|---|---|---|---|
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描述 The NX-DP-GAN039-BSC double pulse evaluation board enables double-pulse testing of GaN FETs in a bottom-side cooled copper-clip package (CCPAK). It is optimized for low inductance and features a high-bandwidth current shunt that can be used to evaluate the switching performance with maximum precision. In addition, it can be used for thermal investigations and continuous operation of 3kW and beyond.
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類型 Evaluation board
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Quick links
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Shop link
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環(huán)境信息
品質及可靠性免責聲明文檔 (14)
| 文件名稱 | 標題 | 類型 | 日期 |
|---|---|---|---|
| BAT54XY | Schottky barrier quadruple diode | Data sheet | 2019-02-12 |
| AN90032 | Low temperature soldering, application study | Application note | 2022-02-22 |
| AN90063 | Questions about package outline drawings | Application note | 2025-10-22 |
| Nexperia_document_guide_MiniLogic_PicoGate_201901 | PicoGate leaded logic portfolio guide | Brochure | 2019-01-07 |
| SOT363 | 3D model for products with SOT363 package | Design support | 2018-12-05 |
| Nexperia_package_poster | Nexperia package poster | Leaflet | 2020-05-15 |
| TSSOP6_SOT363_mk | plastic, surface-mounted package; 6 leads; 1.3 mm pitch; 2 mm x 1.25 mm x 0.95 mm body | Marcom graphics | 2017-01-28 |
| SOT363 | plastic, surface-mounted package; 6 leads; 0.65 mm pitch; 2.1 mm x 1.25 mm x 0.95 mm body | Package information | 2022-06-01 |
| SOT363_115 | TSSOP6; Reel pack for SMD, 7"; Q2/T3 product orientation | Packing information | 2020-06-12 |
| SOT363_125 | TSSOP6 ; Reel pack for SMD, 7"; Q3/T4 product orientation | Packing information | 2020-04-21 |
| BAT54XY_Nexperia_Product_Reliability | BAT54XY Nexperia Product Reliability | Quality document | 2025-05-28 |
| BAT54XY | BAT54XY SPICE model | SPICE model | 2025-10-11 |
| MAR_SOT363 | MAR_SOT363 Topmark | Top marking | 2013-06-03 |
| WAVE_BG-BD-1 | Wave soldering profile | Wave soldering | 2021-09-08 |
Longevity
The Nexperia Longevity Program is aimed to provide our customers information from time to time about the expected time that our products can be ordered. The NLP is reviewed and updated regularly by our Executive Management Team. View our longevity program here.
訂購、定價與供貨
| 型號 | Orderable part number | Ordering code (12NC) | 狀態(tài) | 包裝 | Packing Quantity | 在線購買 |
|---|---|---|---|---|---|---|
| BAT54XY | BAT54XY,115 | 934059127115 | Active | SOT363_115 | 3,000 |
|
| BAT54XY | BAT54XYH | 934059127125 | Active | SOT363_125 | 3,000 |
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樣品
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How does it work?
The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.